The Atomic and Molecular Spectroscopy Group is affiliated with the Research Center of Atomic Physics. We are devoted to X-ray spectroscopy study of interactions between Highly Charged Ions (HCIs) and atoms, molecules, and solid surfaces, based on ion-beam facilities such as HIRFL-CSR, 320 kV heavy-ion high-voltage platform, ECR ion sources, and LEAF.  

1. Electron Capture in collisions between HCIs and atoms, molecules, and solid surfaces 

2. Satellite and Hyper-satellite lines in HCIs 

3. Two-Electron-One-Photon (TEOP) transitions in HCIs 

4. Forward researches associated with the internal target of HIAF 

Interactions between HCIs and atoms, molecules, and solid surfaces are widely investigated in the energy region from keV to GeV, by employing ion-beams of HIRFL-CSR, 320 kV heavy-ion high-voltage platform, ECR ion sources, and LEAF. Nearly 100 papers were published in scientific journals.