FTIR Investigation of C-implanted Amorphous SiO2 after 308 MeV Xe-ion Irradiation......Liu Chunbao et al.----Institute of Modern Physics

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08 12, 2010

FTIR Investigation of C-implanted Amorphous SiO₂ after 308 MeV Xe-ion Irradiation......Liu Chunbao et al.

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